Bit Error Rate Tester 44-Pin PLCC
The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.
- Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems
- Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path
- Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length
- Large 48-bit count and bit error count registers
- Software-programmable bit error insertion
- Fully independent transmit and receive paths
- 8-bit parallel-control port
- Detects polynomial test patterns in the presence of bit error rates up to 10-2
- Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces
- Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3
- Available in 44-pin PLCC
Характеристики
| Бренд | Maxim Integrated |
|---|---|
| Screening Level | Commercial |
| Operating | 50 mA |
| Typical O | 3.3000 V |
| Power Sup | Analog |
| Описание продукта | 16.66 x 16.66 x 3.96 mm |
| Рабочая температура | 0 to 70 °C |
| Schedule B | 8542390000 |
| Type Prod | Bit Error Rate Tester |
| Category | Bit Error Rate Tester |
| HTSN | 8542390001 |
| Страна происхождения | United States |
| Supplier | PLCC |
| Lead Finish | Matte Tin |
| Max Proce | 245 |
| Maximum O | 3.6 V |
| Msl Level | 3 |
| Minimum O | 3 V |
| Maximum D | 622 Mbps |
SKU: DS2174Q+